Keyword : selection of lines to probe


Efficient Guided-Probe Fault Location Method for Sequential Circuits
Xiaoging WEN Kozo KINOSHITA Hideo TAMAMOTO Hiroshi YOKOYAMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/02/25
Vol. E78-D  No. 2 ; pp. 122-129
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
guided-probe fault locationselection of lines to probesequential circuitVLSI diagnosis
 Summary | Full Text:PDF(713KB)