Keyword : seed


A Single Input Change Test Pattern Generator for Sequential Circuits
Feng LIANG ShaoChong LEI ZhiBiao SHAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8 ; pp. 1365-1370
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
built-in self-test (BIST)single input change (SIC) sequenceseedsequential circuit
 Summary | Full Text:PDF(341.7KB)

Seed Selection Procedure for LFSR-Based Random Pattern Generators
Kenichi ICHINO Ko-ichi WATANABE Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A  No. 12 ; pp. 3063-3071
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Timing Verification and Test Generation
Keyword: 
BISTLFSRtest-per-clocktest-per-scanseedpolynomial
 Summary | Full Text:PDF(673.3KB)