Keyword : scan-chain


A VLSI Scan-Chain Optimization Algorithm for Multiple Scan-Paths
Susumu KOBAYASHI Masato EDAHIRO Mikio KUBO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1999/11/25
Vol. E82-A  No. 11 ; pp. 2499-2504
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
VLSI CADscan-chainlayout designdesign for testability
 Summary | Full Text:PDF