Keyword : scan-based DFT


F-Scan: A DFT Method for Functional Scan at RTL
Marie Engelene J. OBIEN Satoshi OHTAKE Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/01/01
Vol. E94-D  No. 1 ; pp. 104-113
Type of Manuscript:  PAPER
Category: Information Network
Keyword: 
scan-based DFTfunctional RTL circuitshigh-level testingassignment decision diagrams
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