Keyword : scan testing


On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption
Yucong ZHANG Stefan HOLST Xiaoqing WEN Kohei MIYASE Seiji KAJIHARA Jun QIAN 
Publication:   
Publication Date: 2021/06/01
Vol. E104-D  No. 6 ; pp. 816-827
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingshift switching activityIR-dropshift failurepartial-shiftscan chain groupinglocal shift switching activity
 Summary | Full Text:PDF

Selective Scan Slice Grouping Technique for Efficient Test Data Compression
Yongjoon KIM Jaeseok PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/02/01
Vol. E93-D  No. 2 ; pp. 380-383
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT)scan testingSoC testtest data compression
 Summary | Full Text:PDF

A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
Yongjoon KIM Jaeseok PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1 ; pp. 193-196
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT)scan testingscan cell reorderinglow power test
 Summary | Full Text:PDF

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
Yongjoon KIM Myung-Hoon YANG Jaeseok PARK Eunsei PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/07/01
Vol. E92-D  No. 7 ; pp. 1462-1465
Type of Manuscript:  LETTER
Category: VLSI Systems
Keyword: 
design for testability (DfT)scan testingtest data compression
 Summary | Full Text:PDF

Test Compression for Robust Testable Path Delay Fault Testing Using Interleaving and Statistical Coding
Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/02/01
Vol. E92-D  No. 2 ; pp. 269-282
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
test compressionstatistical codingrun-length codingdelay fault testingtwo-pattern testingscan testing
 Summary | Full Text:PDF

A Novel ATPG Method for Capture Power Reduction during Scan Testing
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Tatsuya SUZUKI Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/09/01
Vol. E90-D  No. 9 ; pp. 1398-1405
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingcapture powerX-bitIR-drop
 Summary | Full Text:PDF

A New Method for Low-Capture-Power Test Generation for Scan Testing
Xiaoqing WEN Yoshiyuki YAMASHITA Seiji KAJIHARA Laung-Terng WANG Kewal K. SALUJA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/05/01
Vol. E89-D  No. 5 ; pp. 1679-1686
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingcapture powerX-bitIR-drop
 Summary | Full Text:PDF

Average Power Reduction in Scan Testing by Test Vector Modification
Seiji KAJIHARA Koji ISHIDA Kohei MIYASE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1483-1489
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword: 
test power reductionscan testingATPGtest modification
 Summary | Full Text:PDF