Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2014/07/01 Vol. E97-ANo. 7 ;
pp. 1483-1491 Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: NBTI, NBTI mitigation, performance degradation, scan path, aging, reliability,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2010/12/01 Vol. E93-ANo. 12 ;
pp. 2481-2489 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Logic Synthesis, Test and Verification Keyword: scan-based side-channel attack, scan path, testability, cryptosystem, RSA, security,
