Keyword : sample-and-hold amplifier


Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process
Jung-Sheng CHEN Ming-Dou KER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/03/01
Vol. E91-C  No. 3 ; pp. 378-384
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
gate-oxide reliabilitysample-and-hold amplifierdielectric breakdownbootstrapped switchswitched-capacitor circuit
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