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| Keyword : reliability
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Kink Suppression and High Reliability of Asymmetric Dual Channel Poly-Si Thin Film Transistors for High Voltage Bias Stress
Joonghyun PARK Myunghun SHIN | Publication:
Publication Date: 2019/01/01
Vol. E102-C
No. 1 ;
pp. 95-98
Type of Manuscript:
BRIEF PAPER
Category: Semiconductor Materials and Devices
Keyword:
poly-Si, TFT, kink, reliability, hot carrier stress, | | | Summary | Full Text:PDF | |
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Improvement of Reliability Evaluation for 2-Unit Parallel System with Cascading Failures by Using Maximal Copula
Shuhei OTA Takao KAGEYAMA Mitsuhiro KIMURA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2015/10/01
Vol. E98-A
No. 10 ;
pp. 2096-2100
Type of Manuscript:
Special Section LETTER (Special Section on Recent Developments on Reliability, Maintainability and Dependability)
Category:
Keyword:
reliability, parallel system, cascading failure, maximal copula, | | | Summary | Full Text:PDF | |
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Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs
Michitarou YABUUCHI Ryo KISHIDA Kazutoshi KOBAYASHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A
No. 12 ;
pp. 2367-2372
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword:
BTI, process variation, reliability, | | | Summary | Full Text:PDF | |
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Effects of Reliability Measures on Market Share
Masahiro HAYASHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/10/01
Vol. E94-A
No. 10 ;
pp. 2043-2047
Type of Manuscript:
LETTER
Category: Reliability, Maintainability and Safety Analysis
Keyword:
reliability, availability, failure frequency, market share, | | | Summary | Full Text:PDF | |
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Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures
Takashi IMAGAWA Masayuki HIROMOTO Hiroyuki OCHI Takashi SATO | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A
No. 12 ;
pp. 2524-2532
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword:
soft error, TMR, reliability, methodology, | | | Summary | Full Text:PDF | |
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Practical Redundant-Via Insertion Method Considering Manufacturing Variability and Reliability
Yuji TAKASHIMA Kazuyuki OOYA Atsushi KUROKAWA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A
No. 12 ;
pp. 2962-2970
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Physical Level Desing
Keyword:
redundant via, manufacturing variability, reliability, | | | Summary | Full Text:PDF | |
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Reliability Inherent in Heterogeneous Multiprocessor Systems and Task Scheduling for Ameliorating Their Reliability
Makoto SUGIHARA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A
No. 4 ;
pp. 1121-1128
Type of Manuscript:
Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category:
Keyword:
soft error, single event upset, reliability, task scheduling, heterogeneous multiprocessor systems, | | | Summary | Full Text:PDF | |
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Carrier-Grade Ethernet Technologies for Next Generation Wide Area Ethernet
Atsushi IWATA | Publication: IEICE TRANSACTIONS on Communications
Publication Date: 2006/03/01
Vol. E89-B
No. 3 ;
pp. 651-660
Type of Manuscript:
INVITED PAPER (Special Section on the Next Generation Ethernet Technologies)
Category:
Keyword:
MAN, Ethernet, reliability, QoS, OAM, | | | Summary | Full Text:PDF | |
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Low Power and Fault Tolerant Encoding Methods for On-Chip Data Transfer in Practical Applications
Satoshi KOMATSU Masahiro FUJITA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Vol. E88-A
No. 12 ;
pp. 3282-3289
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Low Power Methodology
Keyword:
bus encoding, ECC/EDC, low power, reliability, | | | Summary | Full Text:PDF | |
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A Broadcast Engagement ACK Mechanism for Reliable Broadcast Transmission in Mobile Ad Hoc Networks
Jenhui CHEN Muwen HUANG | Publication: IEICE TRANSACTIONS on Communications
Publication Date: 2005/09/01
Vol. E88-B
No. 9 ;
pp. 3570-3578
Type of Manuscript:
Special Section PAPER (Special Section on Advances in Ad Hoc Mobile Communications and Networking)
Category:
Keyword:
ad hoc, broadcast, network, MAC, reliability, wireless, | | | Summary | Full Text:PDF | |
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Making Reactive Systems Highly Reliable by Hypersequential Programming
Naoshi UCHIHIRA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/04/01
Vol. E88-A
No. 4 ;
pp. 941-947
Type of Manuscript:
Special Section PAPER (Special Section on Selected Papers from the 17th Workshop on Circuits and Systems in Karuizawa)
Category:
Keyword:
reactive system, reliability, scenario, hypersequential programming, | | | Summary | Full Text:PDF | |
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Design and Analysis of a Highly-Available Network File Server Group
Fengjung LIU Chu-sing YANG | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/11/01
Vol. E86-D
No. 11 ;
pp. 2291-2299
Type of Manuscript:
Special Section PAPER (Special Issue on New Technologies in the Internet and their Applications)
Category:
Keyword:
NFS, data consistency, reliability, server group, | | | Summary | Full Text:PDF | |
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Influence of Silicone Vapor on Micro-Motor Reliability
Terutaka TAMAI Kiyoshi OGAWA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2003/06/01
Vol. E86-C
No. 6 ;
pp. 885-890
Type of Manuscript:
Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
Category: Contact Phenomena
Keyword:
silicone vapor, micro-motor, contamination, reliability, SiO2, | | | Summary | Full Text:PDF | |
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Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks
Kazuhiro NOGUCHI Masafumi KOGA | Publication: IEICE TRANSACTIONS on Communications
Publication Date: 2003/05/01
Vol. E86-B
No. 5 ;
pp. 1530-1538
Type of Manuscript:
Special Section PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
Category:
Keyword:
photonic network, optical switch, reliability, | | | Summary | Full Text:PDF | |
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Architecture of a Multigigabit ATM Core Switch for the B-ISDN
Erwin P. RATHGEB | Publication: IEICE TRANSACTIONS on Communications
Publication Date: 1998/02/25
Vol. E81-B
No. 2 ;
pp. 251-257
Type of Manuscript:
Special Section PAPER (Special Issue on ATM Switching Systems for future B-ISDN)
Category: ATM switching architecture
Keyword:
ATM switch, reliability, ATM switch fabric, implementation, | | | Summary | Full Text:PDF | |
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High Responsivity, Low Dark Current, and Highly Reliable Operation of InGaAlAs Waveguide Photodiodes for Optical Hybrid Integration
Hitoshi NAKAMURA Masato SHISHIKURA Shigehisa TANAKA Yasunobu MATSUOKA Tsunao ONO Takao MIYAZAKI Shinji TSUJI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1997/01/25
Vol. E80-C
No. 1 ;
pp. 41-46
Type of Manuscript:
Special Section PAPER (Special Issue on Devices, Packaging Technology, and Subsystems for the Optical Access Network)
Category:
Keyword:
optical access, optical platform, hybrid integration, planar lightwave circuit, waveguide photodiode, photodiode, molecular beam epitaxy, passivation, reliability, | | | Summary | Full Text:PDF | |
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Striping in a Disk Array with Data/Parity Placement Scheme RM2 Tolerating Double Disk Failures*
Chan-Ik PARK | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 1996/08/25
Vol. E79-D
No. 8 ;
pp. 1072-1085
Type of Manuscript:
Special Section PAPER (Special Issue on Architectures, Algorithms and Networks for Massively Parallel Computing)
Category: Disk array
Keyword:
data placement, disk array, performance, reliability, striping, | | | Summary | Full Text:PDF | |
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An Optimum Logical-Design Scheme for Flexible Multi-QoS ATM Networks Guaranteeing Reliability
Eiji OKI Naoaki YAMANAKA | Publication: IEICE TRANSACTIONS on Communications
Publication Date: 1995/07/25
Vol. E78-B
No. 7 ;
pp. 1016-1024
Type of Manuscript:
Special Section PAPER (Special Issue on Multimedia Computer Networks)
Category:
Keyword:
ATM, QoS, network design, reliability, disjoint route, | | | Summary | Full Text:PDF | |
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A New Technique for Evaluating Gate Oxide Reliability Using a Photon Emission Method
Yukiharu URAOKA Kazuhiko TSUJI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C
No. 4 ;
pp. 519-524
Type of Manuscript:
Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword:
reliability, photon emission, TDDB, gate oxide, LOCOS, | | | Summary | Full Text:PDF | |
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1/5 Power Law in PN-Junction Failure Mechanism Caused by Electrical-Over-Stress