Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2006/07/01
Vol. E89-C
No. 7 ;
pp. 943-948
Type of Manuscript:
Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM2005)
Category: High-Speed HBTs and ICs
Keyword:
heterojunction bipolar transistor, reliability, rapid thermal annealing, GaAs, InGaP, |