Keyword : random-pattern-resistant fault


Exact Expected Test Length Generated by LFSRs for Circuits Containing Hard Random-Pattern-Resistant Faults
Kazuhiko IWASAKI Hiroyuki GOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1998/05/25
Vol. E81-A  No. 5 ; pp. 885-888
Type of Manuscript:  Special Section LETTER (Special Section on Discrete Mathematics and Its Applications)
Category: 
Keyword: 
BISTtest lengthrandom-pattern-resistant faultLFSRinteger partition problem
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