Keyword : random variation


Applying Razor Flip-Flops to SRAM Read Circuits
Ushio JIMBO Junji YAMADA Ryota SHIOYA Masahiro GOSHIMA 
Publication:   
Publication Date: 2017/03/01
Vol. E100-C  No. 3 ; pp. 245-258
Type of Manuscript:  Special Section PAPER (Special Section on Low-Power and High-Speed Chips)
Category: 
Keyword: 
random variationtiming fault detection and recoverydynamic voltage and frequency scaling (DVFS)SRAM
 Summary | Full Text:PDF(2MB)

Design Optimization for Process-Variation-Tolerant 22-nm FinFET-Based 6-T SRAM Cell with Worst-Case Sampling Method
Sangheon OH Changhwan SHIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/05/01
Vol. E99-C  No. 5 ; pp. 541-543
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
random variationFinFETSRAMworst-case sampling
 Summary | Full Text:PDF(720.2KB)

Design Guidelines and Process Quality Improvement for Treatment of Device Variations in an LSI Chip
Masakazu AOKI Shin-ichi OHKAWA Hiroo MASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 788-795
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
within-die parameter variationrandom variationsystematic variationcorrelation lengthfitting function
 Summary | Full Text:PDF(2.1MB)