Keyword : random telegraph noise

A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs
Goichi ONO Yuki MORI Michiaki NAKAYAMA Yusuke KANNO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/03/01
Vol. E97-C  No. 3 ; pp. 215-221
Type of Manuscript:  PAPER
Category: Integrated Electronics
random telegraph noisestatic random access memory
 Summary | Full Text:PDF(2.9MB)

Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method
Hiromitsu AWANO Hiroshi TSUTSUI Hiroyuki OCHI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/12/01
Vol. E95-A  No. 12 ; pp. 2272-2283
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
random telegraph noiseBayesian estimationMarkov chain Monte Carlodevice characterizationsource separationstatistical machine learning
 Summary | Full Text:PDF(3.3MB)

Impact of Discrete-Charge-Induced Variability on Scaled MOS Devices
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4 ; pp. 414-420
Type of Manuscript:  INVITED PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
variabilityreliabilityrandom dopant fluctuationrandom telegraph noise
 Summary | Full Text:PDF(924.3KB)