Keyword : random access scan


Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time
Yu HU Yinhe HAN Xiaowei LI Huawei LI Xiaoqing WEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/10/01
Vol. E89-D  No. 10 ; pp. 2616-2625
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
compressionrun-length codingrandom access scanpower dissipationtest application time
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