Keyword : process window for SRAM cell operation


Concise Modeling of Transistor Variations in an LSI Chip and Its Application to SRAM Cell Sensitivity Analysis
Masakazu AOKI Shin-ichi OHKAWA Hiroo MASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4 ; pp. 647-654
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
modeling transistor variationswithin-die variationstatistical analysis for transistor parametersSRAM cell sensitivity analysisprocess window for SRAM cell operation
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