| Keyword : process variation
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Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs Michitarou YABUUCHI Ryo KISHIDA Kazutoshi KOBAYASHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A
No. 12 ;
pp. 2367-2372
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis Keyword: BTI, process variation, reliability, | | Summary | Full Text:PDF(1.2MB) | |
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Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis Shiho HAGIWARA Takanori DATE Kazuya MASU Takashi SATO | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C
No. 4 ;
pp. 280-288
Type of Manuscript:
Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category: Keyword: design for manufacturing, Monte Carlo method, importance sampling, SRAM, process variation, yield, norm minimization, Gaussian mixture models, clustering, hypersphere sampling, | | Summary | Full Text:PDF(1.1MB) | |
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Stochastic Non-homogeneous Arnoldi Method for Analysis of On-Chip Power Grid Networks under Process Variations Zhihua GUI Fan YANG Xuan ZENG | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C
No. 4 ;
pp. 504-510
Type of Manuscript:
Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: Keyword: process variation, power grid, non-homogeneous, ARnoldi, | | Summary | Full Text:PDF(555.8KB) | |
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Variation-Aware Task and Communication Scheduling in MPSoCs for Power-Yield Maximization Mahmoud MOMTAZPOUR Maziar GOUDARZI Esmaeil SANAEI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A
No. 12 ;
pp. 2542-2550
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design Keyword: process variation, task scheduling, power yield, MPSoC, | | Summary | Full Text:PDF(589.4KB) | |
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One-Shot Voltage-Measurement Circuit Utilizing Process Variation Takumi UEZONO Takashi SATO Kazuya MASU | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A
No. 4 ;
pp. 1024-1030
Type of Manuscript:
Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category: Keyword: voltage measurement, process variation, power/signal integrity, | | Summary | Full Text:PDF(525.2KB) | |
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