Keyword : process variability


A Standard-Cell Based On-Chip NMOS and PMOS Performance Monitor for Process Variability Compensation
Toshiyuki YAMAGISHI Tatsuo SHIOZAWA Koji HORISAKI Hiroyuki HARA Yasuo UNEKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Vol. E96-C  No. 6 ; pp. 894-902
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
on chipmonitordigitalprocess variabilitystandard cellarea efficiency
 Summary | Full Text:PDF

All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
Tetsuya IIZUKA Kunihiro ASADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4 ; pp. 627-634
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
process variabilityall digitalon-chip monitorbuffer ring
 Summary | Full Text:PDF

All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter
Tetsuya IIZUKA Jaehyun JEONG Toru NAKURA Makoto IKEDA Kunihiro ASADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 487-494
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
process variabilityall digitalon-chip monitorbuffer ringNBTIPBTI
 Summary | Full Text:PDF