Keyword : probing


Recent Advances in Measurement Techniques for Microwave Active Devices and Circuits
Yasushi ITOH Kazuhiko HONJO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5 ; pp. 657-664
Type of Manuscript:  REVIEW PAPER
Category: 
Keyword: 
microwavesmeasurementactive devicecircuitvector network analysisload-pullprobingsamplingsensing
 Summary | Full Text:PDF

SIFLAP-G: A Method of Diagnosing Gate-Level Faults in Combinational Circuits
Koji YAMAZAKI Teruhiko YAMADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 826-831
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
fault diagnosisgate-level faultcombinational circuitprobing
 Summary | Full Text:PDF