Keyword : power/signal integrity

A Time-Slicing Ring Oscillator for Capturing Time-Dependent Delay Degradation and Power Supply Voltage Fluctuation
Takumi UEZONO Kazuya MASU Takashi SATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C  No. 3 ; pp. 324-331
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
voltage measurementspatial voltage drop fluctuationprocess variationpower/signal integrity
 Summary | Full Text:PDF

One-Shot Voltage-Measurement Circuit Utilizing Process Variation
Takumi UEZONO Takashi SATO Kazuya MASU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4 ; pp. 1024-1030
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
voltage measurementprocess variationpower/signal integrity
 Summary | Full Text:PDF