Keyword : plasma

Laser Breakdown 3D Display
Aleksandr CHEKHOVSKIY Yasutaka OHIRA Hiroshi TOSHIYOSHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/10/01
Vol. E91-C  No. 10 ; pp. 1616-1620
Type of Manuscript:  INVITED PAPER (Special Section on Electronic Displays)
Category: 
Keyword: 
color, plasma, laser, breakdown, 3D display, 
 Summary | Full Text:PDF
Design of 1 m2 Order Plasma Excitation Single-Layer Slotted Waveguide Array with Conducting Baffles and Quartz Glass Strips Using the GSM-MoM Analysis
Takuichi HIRANO Kimio SAKURAI Jiro HIROKAWA Makoto ANDO Tetsuya IDE Atsushi SASAKI Kazufumi AZUMA Yukihiko NAKATA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2006/05/01
Vol. E89-B  No. 5 ; pp. 1627-1635
Type of Manuscript:  PAPER
Category: Antennas and Propagation
Keyword: 
slotted waveguide arrays, unit cell, plasma, generalized scattering matrix method, method of moments, baffles, 
 Summary | Full Text:PDF
Novel High-Throughput Plasma Enhanced Growth of SiGe in a 200 mm/300 mm Single Wafer Cluster Tool
Juergen RAMM Hans von KANEL 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/10/01
Vol. E86-C  No. 10 ; pp. 1935-1942
Type of Manuscript:  INVITED PAPER (Special Issue on Heterostructure Microelectronics with TWHM2003)
Category: 
Keyword: 
epitaxy, virtual substrate, strained silicon, low temperature, pre-epi clean, plasma, 
 Summary | Full Text:PDF
Influence of Non-uniform Electric Field on the Firing Voltage of Surface Discharge AC-PDPs
Mitsuyoshi MAKINO Toshihiro YOSHIOKA Takeshi SAITO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/08/25
Vol. E80-C  No. 8 ; pp. 1086-1090
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Emissive Displays)
Category: 
Keyword: 
plasma, display, discharge, firing voltage, Paschen's law, 
 Summary | Full Text:PDF
Evaluation of Plasma Damage to Gate Oxide
Yukiharu URAOKA Koji ERIGUCHI Tokuhiko TAMAKI Kazuhiko TSUJI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3 ; pp. 453-458
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Process Technology
Keyword: 
QBD, gate oxide, plasma, reliability, damage, photon emission, LOCOS, thinning, 
 Summary | Full Text:PDF