Keyword : performance degradation

Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation
Shumpei MORITA Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/07/01
Vol. E100-A  No. 7 ; pp. 1464-1472
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTI mitigation, reliability, transistor aging, performance degradation, internal node control, 
 Summary | Full Text:PDF
NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time
Hiroaki KONOURA Toshihiro KAMEDA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1483-1491
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTI, NBTI mitigation, performance degradation, scan path, aging, reliability, 
 Summary | Full Text:PDF
Performability Modeling for Software System with Performance Degradation and Reliability Growth
Koichi TOKUNO Shigeru YAMADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/07/01
Vol. E92-A  No. 7 ; pp. 1563-1571
Type of Manuscript:  Special Section PAPER (Special Section on Recent Advances in Technologies for Assessing System Reliability)
Category: 
Keyword: 
performability, real-time property, performance degradation, software reliability growth, infinite-server queueing model, 
 Summary | Full Text:PDF
A Study on Performance Degradation of Digital Electronic Equipment under Electromagnetic Disturbance
Takehiro TAKAHASHI Hironori OKANIWA Takashi SAKUSABE Noboru SCHIBUYA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2007/06/01
Vol. E90-B  No. 6 ; pp. 1338-1343
Type of Manuscript:  Special Section PAPER (Special Section on 2nd Pan-Pacific EMC Joint Meeting--PPEMC'06--)
Category: Measurement and Immunity
Keyword: 
digital electronic equipment, performance degradation, through-put, near field measurement, electromagnetic disturbance, interference of intra-equipment, 
 Summary | Full Text:PDF