Keyword : per-test

A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits
Yuta YAMATO Yusuke NAKAMURA Kohei MIYASE Xiaoqing WEN Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 667-674
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
fault diagnosis, X-fault model, per-test, via, 
 Summary | Full Text:PDF
A Per-Test Fault Diagnosis Method Based on the X-Fault Model
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Yuta YAMATO Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/11/01
Vol. E89-D  No. 11 ; pp. 2756-2765
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
fault diagnosis, per-test, X-fault model, 
 Summary | Full Text:PDF