Keyword : partial-shift


On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption
Yucong ZHANG Stefan HOLST Xiaoqing WEN Kohei MIYASE Seiji KAJIHARA Jun QIAN 
Publication:   
Publication Date: 2021/06/01
Vol. E104-D  No. 6 ; pp. 816-827
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingshift switching activityIR-dropshift failurepartial-shiftscan chain groupinglocal shift switching activity
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