Keyword : oxide leakage current


A Novel Programming Method Using a Reverse Polarity Pulse in Flash EEPROMs
Hirohisa IIZUKA Tetsuo ENDOH Seiichi ARITOME Riichiro SHIROTA Fujio MASUOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/06/25
Vol. E79-C  No. 6 ; pp. 832-835
Type of Manuscript:  Special Section PAPER (Special Issue on ULSI Memory Technology)
Category: Nonvolatile memories
Keyword: 
flash EEPROMoxide leakage currenthole trapreverse polarity pulseread disturb
 Summary | Full Text:PDF