A Method for Evaluating Degradation Phenomenon of Electrical Contacts Using a Micro-Sliding Mechanism — Minimal Sliding Amplitudes against Input Waveforms — Shin-ichi WADAKoichiro SAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/04/01 Vol. E92-ANo. 4 ;
pp. 990-997 Type of Manuscript: Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa) Category: Keyword: SSTA, output, transition time, gate delay model, process variation,