Keyword : operation regions


Fault Behavior and Change in Internal Condition of Mixed-Signal Circuits
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/04/25
Vol. E83-D  No. 4 ; pp. 943-945
Type of Manuscript:  LETTER
Category: Fault Tolerance
Keyword: 
CMOS mixed-signal circuitsfault analysisMOS transistorsoperation regionstesting
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