Keyword : open defects


A Design for Testability of Open Defects at Interconnects in 3D Stacked ICs
Fara ASHIKIN Masaki HASHIZUME Hiroyuki YOTSUYANAGI Shyue-Kung LU Zvi ROTH 
Publication:   
Publication Date: 2018/08/01
Vol. E101-D  No. 8 ; pp. 2053-2063
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
3D stacked ICopen defectsdesign-for-testabilitythrough-silicon viaelectrical interconnect test
 Summary | Full Text:PDF

Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field
Hiroyuki YOTSUYANAGI Taisuke IWAKIRI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D  No. 12 ; pp. 2666-2673
Type of Manuscript:  Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword: 
open defectssupply current testCMOS circuitselectric field
 Summary | Full Text:PDF