Keyword : on-wafer measurement


Automated Millimeter-Wave On-Wafer Testing System
Takayuki KATOH Takuo KASHIWA Hiroyuki HOSHI Akira INOUE Takahide ISHIKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/07/25
Vol. E82-C  No. 7 ; pp. 1312-1317
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology)
Category: Measurements
Keyword: 
millimeter waveS-parameternoise figureMMICon-wafer measurement
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