Keyword : on-chip noise monitoring


Measurements and Simulation of Sensitivity of Differential-Pair Transistors against Substrate Voltage Variation
Satoshi TAKAYA Yoji BANDO Toru OHKAWA Toshiharu TAKARAMOTO Toshio YAMADA Masaaki SOUDA Shigetaka KUMASHIRO Tohru MOGAMI Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Vol. E96-C  No. 6 ; pp. 884-893
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
mixed signal VLSI circuitsubstrate crosstalkon-chip noise monitoring
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