Keyword : off-state stress


Experimental Demonstration of Post-Fabrication Self-Improvement of SRAM Cell Stability by High-Voltage Stress
Toshiro HIRAMOTO Anil KUMAR Takuya SARAYA Shinji MIYANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Vol. E96-C  No. 6 ; pp. 759-765
Type of Manuscript:  INVITED PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
transistorMOSFETvariabilityoff-state stress
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