Keyword : observability


Local Information, Observable Parameters, and Global View
Hiroshi SAITO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2013/12/01
Vol. E96-B  No. 12 ; pp. 3017-3027
Type of Manuscript:  INVITED PAPER
Category: 
Keyword: 
local informationglobal informationsensorsensing resultshape estimationintegral geometrynetwork tomographyquality estimationobservability
 Summary | Full Text:PDF(743KB)

Novel Techniques for Improving Testability Analysis
Yin-He SU Ching-Hwa CHENG Shih-Chieh CHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/12/01
Vol. E85-A  No. 12 ; pp. 2901-2912
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
testabilitycontrollabilityobservabilityTAIRCOP
 Summary | Full Text:PDF(2.1MB)

EB-Testing-Pad Method and its Evaluation by Actual Devices
Norio KUJI Takako ISHIHARA Shigeru NAKAJIMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1558-1563
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: EB Tester
Keyword: 
E-beam testerobservabilitystacked viastesting padsmulti level wiring
 Summary | Full Text:PDF(626.7KB)

Weak Normality for Nonblocking Supervisory Control of Discrete Event Systems under Partial Observation
Shigemasa TAKAI Toshimitsu USHIO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/11/01
Vol. E84-A  No. 11 ; pp. 2822-2828
Type of Manuscript:  Special Section PAPER (Special Section on Concurrent Systems Technology)
Category: 
Keyword: 
discrete event systemnonblocking supervisory controlpartial observationobservabilitynormality
 Summary | Full Text:PDF(217.9KB)

Improvement of E-Beam Observability by Testing-Pad Placement in LSI Design Layout
Norio KUJI Tadao TAKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/02/25
Vol. E82-C  No. 2 ; pp. 387-392
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
E-beam testerobservabilitystacked viastesting padsmulti-level wiringlocal field effects
 Summary | Full Text:PDF(388.5KB)

The Controlling Value Boolean Matching
Ricardo FERREIRA Anne-Marie TRULLEMANS Qinhai ZHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1997/10/25
Vol. E80-A  No. 10 ; pp. 1749-1755
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
Boolean matchingobservabilitytechnology mappingsignatures
 Summary | Full Text:PDF(552.3KB)