Keyword : noise figure measurement

An Accurate and Low-Cost Method for On-Wafer LNA Noise Figure Measurement
Sheng-Yu WEN Guo-Wei HUANG Kun-Ming CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5 ; pp. 742-748
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
on-wafernoise figure measurementlow-noise amplifier
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