Keyword : negative bias temperature instability (NBTI)


Reducing Aging Effects on Ternary CAM
Ing-Chao LIN Yen-Han LEE Sheng-Wei WANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/07/01
Vol. E99-C  No. 7 ; pp. 878-891
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
ternary content addressable memory (CAM)negative bias temperature instability (NBTI)positive bias temperature instability (PBTI)reliabilitypower gating
 Summary | Full Text:PDF

Temperature-Aware NBTI Modeling Techniques in Digital Circuits
Hong LUO Yu WANG Rong LUO Huazhong YANG Yuan XIE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/06/01
Vol. E92-C  No. 6 ; pp. 875-886
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
negative bias temperature instability (NBTI)temperaturereliability
 Summary | Full Text:PDF