Keyword : nanometer technology


An Effective Model of the Overshooting Effect for Multiple-Input Gates in Nanometer Technologies
Li DING Zhangcai HUANG Atsushi KUROKAWA Jing WANG Yasuaki INOUE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/05/01
Vol. E97-A  No. 5 ; pp. 1059-1074
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
gate delayovershooting effectmultiple-input gatesnanometer technology
 Summary | Full Text:PDF(2.4MB)

InGaAs/GaAs Tetrahedral-Shaped Recess Quantum Dot(TSR-QD)Technology
Yuji AWANO Yoshiki SAKUMA Yoshihiro SUGIYAMA Takashi SEKIGUCHI Shunichi MUTO Naoki YOKOYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/11/25
Vol. E79-C  No. 11 ; pp. 1557-1561
Type of Manuscript:  Special Section PAPER (Special Issue on Quantum Effect Devices and Their Fabrication Technologies)
Category: 
Keyword: 
nanometer technologyquantum dotMOVPEcathodoluminescencephotoluminescenceself-organization
 Summary | Full Text:PDF(716.3KB)