Keyword : nanograting


Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels
Takashi ITO Xiaoli ZHU Shin-Ichiro KUROKI Koji KOTANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/11/01
Vol. E93-C  No. 11 ; pp. 1638-1644
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
nanogratingcurrent driveeffective mobilityreliabilityTDDBNBTI
 Summary | Full Text:PDF