Keyword : multiple-valued pattern

Associative Neural Network Models Based on a Measure of Manhattan Length
Hiroshi UEDA Yoichiro ANZAI Masaya OHTA Shojiro YONEDA Akio OGIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/03/25
Vol. E76-A  No. 3 ; pp. 277-283
Type of Manuscript:  Special Section PAPER (Special Section on the 5th Karuizawa Workshop on Circuits and Systems)
neural networkassociative memoryPDNlateral inhibitionmultiple-valued pattern
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