Keyword : multiple-input gates


An Effective Model of the Overshooting Effect for Multiple-Input Gates in Nanometer Technologies
Li DING Zhangcai HUANG Atsushi KUROKAWA Jing WANG Yasuaki INOUE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/05/01
Vol. E97-A  No. 5 ; pp. 1059-1074
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
gate delayovershooting effectmultiple-input gatesnanometer technology
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