Keyword : multiple stuck-at fault


Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair Analysis
Seiji KAJIHARA Rikiya NISHIGAYA Tetsuji SUMIOKA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7 ; pp. 811-816
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
test generationmultiple stuck-at faultvector pair analysiscombinational circuit
 Summary | Full Text:PDF