Keyword : multiple divide


Analysis of Phase Noise Degradation Considering Switch Transistor Capacitances for CMOS Voltage Controlled Oscillators
Rui MURAKAMI Shoichi HARA Kenichi OKADA Akira MATSUZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/06/01
Vol. E93-C  No. 6 ; pp. 777-784
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
CMOSVCOinductorphase noisequality factormultiple divideswitched capacitor
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