Keyword : microelectronics


Characterisation of Offset Lithographic Films Using Microelectronic Test Structures
Anthony J. WALTON J. Tom M. STEVENSON Leslie I. HAWORTH Martin FALLON Peter S. A. EVANS Blue J. RAMSEY David HARRISON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/25
Vol. E82-C  No. 4 ; pp. 576-581
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
microelectronicstest structureoffset lithographylinewidth
 Summary | Full Text:PDF(780.7KB)

Technological Trends and Key Technologies in Intelligent Vehicles
Takao SASAYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/12/25
Vol. E76-C  No. 12 ; pp. 1717-1726
Type of Manuscript:  INVITED PAPER (Special Issue on ASICs for Automotive Electronics)
Category: 
Keyword: 
automotive electronicsintelligent vehiclesmicroelectronicssensingvehicle informatics
 Summary | Full Text:PDF(942.5KB)