Keyword : metric learning


Partial Label Metric Learning Based on Statistical Inference
Tian XIE Hongchang CHEN Tuosiyu MING Jianpeng ZHANG Chao GAO Shaomei LI Yuehang DING 
Publication:   
Publication Date: 2020/06/01
Vol. E103-D  No. 6 ; pp. 1355-1361
Type of Manuscript:  PAPER
Category: Artificial Intelligence, Data Mining
Keyword: 
partial label learningmetric learningstatistical inferencelikelihood-ratio test
 Summary | Full Text:PDF(1.5MB)

Adversarial Metric Learning with Naive Similarity Discriminator
Yi-ze LE Yong FENG Da-jiang LIU Bao-hua QIANG 
Publication:   
Publication Date: 2020/06/01
Vol. E103-D  No. 6 ; pp. 1406-1413
Type of Manuscript:  PAPER
Category: Image Processing and Video Processing
Keyword: 
metric learningadversarial learningnaive similarity discriminator
 Summary | Full Text:PDF(839.8KB)

Threshold Auto-Tuning Metric Learning
Rachelle RIVERO Yuya ONUMA Tsuyoshi KATO 
Publication:   
Publication Date: 2019/06/01
Vol. E102-D  No. 6 ; pp. 1163-1170
Type of Manuscript:  PAPER
Category: Pattern Recognition
Keyword: 
metric learningITMLcovariance descriptordistance constraint
 Summary | Full Text:PDF(423.9KB)

Stochastic Dykstra Algorithms for Distance Metric Learning with Covariance Descriptors
Tomoki MATSUZAWA Eisuke ITO Raissa RELATOR Jun SESE Tsuyoshi KATO 
Publication:   
Publication Date: 2017/04/01
Vol. E100-D  No. 4 ; pp. 849-856
Type of Manuscript:  PAPER
Category: Pattern Recognition
Keyword: 
covariance descriptormetric learningconvex optimizationstochastic optimizationDykstra algorithm
 Summary | Full Text:PDF(554.3KB)

Face Hallucination by Learning Local Distance Metric
Yuanpeng ZOU Fei ZHOU Qingmin LIAO 
Publication:   
Publication Date: 2017/02/01
Vol. E100-D  No. 2 ; pp. 384-387
Type of Manuscript:  LETTER
Category: Image Processing and Video Processing
Keyword: 
face hallucinationface super-resolutionmetric learning
 Summary | Full Text:PDF(974.9KB)

Utilizing Shape-Based Feature and Discriminative Learning for Building Detection
Shangqi ZHANG Haihong SHEN Chunlei HUO 
Publication:   
Publication Date: 2017/02/01
Vol. E100-D  No. 2 ; pp. 392-395
Type of Manuscript:  LETTER
Category: Image Recognition, Computer Vision
Keyword: 
building detectionshape-specific featuremetric learningfeature classification
 Summary | Full Text:PDF(2MB)

Nonlinear Metric Learning with Deep Independent Subspace Analysis Network for Face Verification
Xinyuan CAI Chunheng WANG Baihua XIAO Yunxue SHAO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/12/01
Vol. E96-D  No. 12 ; pp. 2830-2838
Type of Manuscript:  PAPER
Category: Image Recognition, Computer Vision
Keyword: 
metric learningindependent subspace analysisdeep learning architectureface verification
 Summary | Full Text:PDF(1.1MB)