Keyword : memory-cell leakage current


Plate Bumping Leakage Current Measurement Method and Its Application to Data Retention Characteristic Analysis for RJB DRAM Cells
Toru IWATA Hiroyuki YAMAUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/12/25
Vol. E79-C  No. 12 ; pp. 1707-1712
Type of Manuscript:  Special Section PAPER (Special Issue on Low-Power LSI Technologies)
Category: 
Keyword: 
DRAMdata retentionmemory-cell leakage current
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