Keyword : memory macro


Guided-Probe Diagnosis of LSIs Containing Macrocells
Norio KUJI Tadao TAKEDA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 731-737
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Beam Testing/Diagnosis
Keyword: 
electron beam testerguided-probe diagnosismacrocellmemory macrologic simulationlogic modelCAD navigation
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