Keyword : masking

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST
Akihiro TOMITA Xiaoqing WEN Yasuo SATO Seiji KAJIHARA Kohei MIYASE Stefan HOLST Patrick GIRARD Mohammad TEHRANIPOOR Laung-Terng WANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/10/01
Vol. E97-D  No. 10 ; pp. 2706-2718
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
at-speed scan-based logic BIST, capture power safety, masking, IR-drop, transition delay fault, long sensitized path, 
 Summary | Full Text:PDF
A New Type of Fault-Based Attack: Fault Behavior Analysis
Yang LI Kazuo OHTA Kazuo SAKIYAMA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2013/01/01
Vol. E96-A  No. 1 ; pp. 177-184
Type of Manuscript:  Special Section PAPER (Special Section on Cryptography and Information Security)
Category: Implementation
Keyword: 
fault-based attack, AES, faulty behavior, physical attacks, masking, 
 Summary | Full Text:PDF
Power Analysis against a DPA-Resistant S-Box Implementation Based on the Fourier Transform
Yang LI Kazuo SAKIYAMA Shinichi KAWAMURA Kazuo OHTA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/01/01
Vol. E94-A  No. 1 ; pp. 191-199
Type of Manuscript:  Special Section PAPER (Special Section on Cryptography and Information Security)
Category: Implementation
Keyword: 
side channel attacks, masking, Fourier transform, s-box, probability density function, 
 Summary | Full Text:PDF
An Objective Measure Based on an Auditory Model for Assessing Low-Rate Coded Speech
Toshiro WATANABE Shinji HAYASHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/06/25
Vol. E78-D  No. 6 ; pp. 751-757
Type of Manuscript:  Special Section PAPER (Special Issue on Spoken Language Processing)
Category: 
Keyword: 
speech coding, objective measure, quality assessment, critical-band filter, masking, 
 Summary | Full Text:PDF