Keyword : low gate-oxide stress

CMOS Charge Pumps Using Cross-Coupled Charge Transfer Switches with Improved Voltage Pumping Gain and Low Gate-Oxide Stress for Low-Voltage Memory Circuits
Kyeong-Sik MIN Jin-Hong AHN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/01/01
Vol. E85-C  No. 1 ; pp. 225-229
Type of Manuscript:  LETTER
Category: Electronic Circuits
charge pumplow voltagememory circuitlow gate-oxide stress
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