Keyword : lot size


Effect of 300 mm Wafer Transition and Test Processing Logistics on VLSI Manufacturing Final Test Process Efficiency and Cost
Akihisa CHIKAMURA Koji NAKAMAE Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/25
Vol. E82-C  No. 4 ; pp. 638-645
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
300 mm waferlot sizetest processing logisticsproduction dispatching rule schedulingexpress lotcostfinal test processLSI manufacturingdiscrete event simulation
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