Keyword : logical masking


Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path
Go MATSUKAWA Yuta KIMI Shuhei YOSHIDA Shintaro IZUMI Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/06/01
Vol. E99-A  No. 6 ; pp. 1198-1205
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
single event effectsingle event upsetsoft error propagationlogical maskingtemporal masking
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