Keyword : logic LSI

Fault Diagnosis Technique for Yield Enhancement of Logic LSI Using IDDQ
Masaru SANADA Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/05/25
Vol. E83-A  No. 5 ; pp. 842-850
Type of Manuscript:  Special Section PAPER (Special Section on Reliability Theory and Its Applications)
Category: 
Keyword: 
IDDQ, visual abnormalities, logic LSI, fault diagnosis, physical damages, 
 Summary | Full Text:PDF
Low Power Management Method for PDS ONU Logic LSIs
Koichi SAITO Kiyoshi MATSUMOTO Kennosuke FUKAMI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1998/03/25
Vol. E81-B  No. 3 ; pp. 604-608
Type of Manuscript:  PAPER
Category: Communication Device and Circuit
Keyword: 
LSI, logic LSI, low power, PDS, ONU, 
 Summary | Full Text:PDF