Keyword : logic LSI


Fault Diagnosis Technique for Yield Enhancement of Logic LSI Using IDDQ
Masaru SANADA Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/05/25
Vol. E83-A  No. 5 ; pp. 842-850
Type of Manuscript:  Special Section PAPER (Special Section on Reliability Theory and Its Applications)
Category: 
Keyword: 
IDDQvisual abnormalitieslogic LSIfault diagnosisphysical damages
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Low Power Management Method for PDS ONU Logic LSIs
Koichi SAITO Kiyoshi MATSUMOTO Kennosuke FUKAMI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1998/03/25
Vol. E81-B  No. 3 ; pp. 604-608
Type of Manuscript:  PAPER
Category: Communication Device and Circuit
Keyword: 
LSIlogic LSIlow powerPDSONU
 Summary | Full Text:PDF