Keyword : load current stress

Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability
Shujuan WANG Qiong YU Li REN Wanbin REN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/08/01
Vol. E92-C  No. 8 ; pp. 1034-1039
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices (IS-EMD2008))
Category: Relacys & Switches
relaysaccelerated life testload current stressfailure mechanismfailure model
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