Keyword : linewidth

Optical DP-High Order-QAM Transmission System for High-Speed Short Links Utilizing Copropagating Twin Local Lights
Hiroto KAWAKAMI Takayuki KOBAYASHI Yutaka MIYAMOTO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2016/08/01
Vol. E99-B  No. 8 ; pp. 1799-1804
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Information and Communication Technologies and Services in Conjunction with Main Topics of APCC2015)
Category: Transmission Systems and Transmission Equipment for Communications
Keyword: 
QAM, digital coherent detection, phase noise, linewidth, 
 Summary | Full Text:PDF
Measurement of the Linewidth of a Frequency-tunable Laser Used in Optical Coherence Tomography
Yoshifumi TAKASAKI Keiji KURODA Yuzo YOSHIKUNI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/03/01
Vol. E98-C  No. 3 ; pp. 275-278
Type of Manuscript:  BRIEF PAPER
Category: Optoelectronics
Keyword: 
coherence, frequency, delayed self-heterodyne, linewidth, 
 Summary | Full Text:PDF
Optical Phase Estimation in an Urban Wireless Communications Enviroment
Juan DE DIOS SANCHEZ LOPES Arturo ARVIZU MONDRAGON Javier MENDIETA JIMENEZ 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2008/07/01
Vol. E91-B  No. 7 ; pp. 2447-2450
Type of Manuscript:  LETTER
Category: Optical Wireless Communications
Keyword: 
optical wireless, coherent, turbulence, linewidth, 
 Summary | Full Text:PDF
Characterisation of Offset Lithographic Films Using Microelectronic Test Structures
Anthony J. WALTON J. Tom M. STEVENSON Leslie I. HAWORTH Martin FALLON Peter S. A. EVANS Blue J. RAMSEY David HARRISON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/04/25
Vol. E82-C  No. 4 ; pp. 576-581
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
microelectronics, test structure, offset lithography, linewidth, 
 Summary | Full Text:PDF
Effects of Field Edge Steps on Electrical Gate Linewidth Measurements
Naoki KASAI Ichiro YAMAMOTO Koji URABE Kuniaki KOYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 152-157
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
test structure, MOSFET, linewidth, field step, 
 Summary | Full Text:PDF